In the field of mobile-device forensics, the practices of “chip-off” and  “JTAG” analysis have become topics of growing interest among the  community. As mobile devices continue to bring new challenges to the  examiner, these two disciplines warrant close attention, as they both  offer examiners avenues for deeper data access, the ability to bypass  lock codes, and a way to recover data from damaged devices…………………………………..to read the full article, please follow the link below:

http://evidencemagazine.com/v10n3.htm

Happy Reading!

Thanks to Bill Teel of Teel Technologies for the assistance in writing and editing the article.

Bob

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